A functional test algorithm for the register forwarding and pipeline interlocking unit in pipelined microprocessors

P. Bernardi, D. Boyang, Lyl M. Ciganda Brasca, E. Sánchez, M. Reorda, M. Grosso, O. Ballan
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引用次数: 6

Abstract

When the result of a previous instruction is needed in the pipeline before it is available, a “data hazard” occurs. Register Forwarding and Pipeline Interlock (RF&PI) are mechanisms suitable to avoid data corruption and to limit the performance penalty caused by data hazards in pipelined microprocessors. Data hazards handling is part of the microprocessor control logic; its test can hardly be achieved with a functional approach, unless a specific test algorithm is adopted. In this paper we analyze the causes for the low functional testability of the RF&PI logic and propose some techniques able to effectively perform its test. In particular, we describe a strategy to perform Software-Based Self-Test (SBST) on the RF&PI unit. The general structure of the unit is analyzed, a suitable test algorithm is proposed and the strategy to observe the test responses is explained. The method can be exploited for test both at the end of manufacturing and in the operational phase. Feasibility and effectiveness of the proposed approach are demonstrated on both an academic MIPS-like processor and an industrial System-on-Chip based on the Power ArchitectureTM.
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流水线微处理器中寄存器转发和流水线联锁单元的功能测试算法
当管道中需要之前的指令的结果时,就会发生“数据危害”。寄存器转发和管道互锁(RF&PI)是一种适用于避免数据损坏和限制在流水线微处理器中由于数据危害而造成的性能损失的机制。数据危害处理是微处理器控制逻辑的一部分;除非采用特定的测试算法,否则它的测试很难用函数方法来实现。本文分析了RF&PI逻辑功能可测试性低的原因,并提出了一些能够有效进行RF&PI逻辑测试的技术。特别地,我们描述了在RF&PI单元上执行基于软件的自测(SBST)的策略。分析了该装置的一般结构,提出了一种合适的测试算法,并说明了观察测试响应的策略。该方法既可用于制造末期的测试,也可用于运行阶段的测试。在类似mips的学术处理器和基于功率架构的工业片上系统上验证了该方法的可行性和有效性。
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