Schottky barrier photodiodes in Hg1-xCdxTe

D. Polla, A. K. Sood
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引用次数: 24

Abstract

Schottky Barrier photodiodes have been fabricated on p-Hg1-xCdxTe (0.20≤ × ≤ 0.38) with aluminum, chromium, lead and manganese as barrier metals. Various electrical characterizations have been carried out to determine barrier heights and the results are found to be in excellent agreement with theory. These photodiodes have also been used to determine the minority carrier lifetime and diffusion length in p-Hg1-xCdxTe.
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Hg1-xCdxTe的肖特基势垒光电二极管
以铝、铬、铅、锰为势垒金属,在p- h_1 - xcdxte(0.20≤x≤0.38)上制备了肖特基势垒光电二极管。为了确定势垒高度,进行了各种各样的电特性分析,结果与理论非常吻合。这些光电二极管也被用来测定p-Hg1-xCdxTe中的少数载流子寿命和扩散长度。
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