Consolidating test resources for avionics production test - requirements and applications

W. Sonnenberg, Alex Sharpio, M. Dewey
{"title":"Consolidating test resources for avionics production test - requirements and applications","authors":"W. Sonnenberg, Alex Sharpio, M. Dewey","doi":"10.1109/AUTEST.2009.5314058","DOIUrl":null,"url":null,"abstract":"The manufacturing and test of avionics products for military and commercial aircraft presents a unique set of requirements and challenges. Historically, the development and deployment of production test systems for avionics products such as aircraft data acquisition and recording systems, navigation and communication products, and aircraft network systems have been addressed on a product specific basis - resulting in a variety of test platforms and solutions with little test system commonality and technology. Additionally, this lack of test system commonality and the requirement to maintain legacy products with long product life cycles results in increased maintenance and logistics costs for manufacturing and support test. Consequently, the adoption of a common test platform can offer producers of avionics products lower test costs, improved test resource utilization, and the flexibility to support both new and legacy products. This paper reviews the requirements and the implementation of a common test platform and environment that offers a high level of efficiency, supports the implementation of routine test processes, offers reusability, and allows the consolidation of test resources to facilitate the collection of reliability data and test results.","PeriodicalId":187421,"journal":{"name":"2009 IEEE AUTOTESTCON","volume":"37 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 IEEE AUTOTESTCON","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AUTEST.2009.5314058","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

The manufacturing and test of avionics products for military and commercial aircraft presents a unique set of requirements and challenges. Historically, the development and deployment of production test systems for avionics products such as aircraft data acquisition and recording systems, navigation and communication products, and aircraft network systems have been addressed on a product specific basis - resulting in a variety of test platforms and solutions with little test system commonality and technology. Additionally, this lack of test system commonality and the requirement to maintain legacy products with long product life cycles results in increased maintenance and logistics costs for manufacturing and support test. Consequently, the adoption of a common test platform can offer producers of avionics products lower test costs, improved test resource utilization, and the flexibility to support both new and legacy products. This paper reviews the requirements and the implementation of a common test platform and environment that offers a high level of efficiency, supports the implementation of routine test processes, offers reusability, and allows the consolidation of test resources to facilitate the collection of reliability data and test results.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
整合航空电子产品试验资源。试验要求和应用
军用和商用飞机的航空电子产品的制造和测试提出了一套独特的要求和挑战。从历史上看,航空电子产品(如飞机数据采集和记录系统、导航和通信产品以及飞机网络系统)的生产测试系统的开发和部署都是在特定产品的基础上进行的,导致各种测试平台和解决方案缺乏测试系统通用性和技术。此外,测试系统通用性的缺乏以及维护具有较长产品生命周期的遗留产品的需求导致了制造和支持测试的维护和物流成本的增加。因此,采用通用测试平台可以为航空电子产品生产商提供更低的测试成本,提高测试资源利用率,以及支持新产品和旧产品的灵活性。本文回顾了一个通用测试平台和环境的需求和实现,它提供了高水平的效率,支持常规测试过程的实现,提供了可重用性,并允许测试资源的整合,以促进可靠性数据和测试结果的收集。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Common S2ENCE maintenance Higher-level development and COTS hardware expand FPGA boundaries A wavelet packets and PCA based method for testing of analog circuits Powering intelligent instruments with Lua scripting Digital Signals in IEEE 1641 and ATML
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1