N. Rezzak, Jih-Jong Wang, Alex Cai, F. Hawley, E. Hamdy
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引用次数: 0
Abstract
This paper presents Total Ionizing Dose (TID) results on 28nm PolarFire™ SONOS-based FPGA. Gamma and X-ray induced TID effects at the device and product level are presented and discussed. PolarFire shows very good TID performance and is radiation-tolerant up to 100 krad(SiO2).
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