Y. R. Rodrigues, M. F. Zambroni de Souza, A. C. Zambroni de Souza, B. I. Lima Lopes, D. Q. Oliveira
{"title":"Unbalanced load flow for microgrids considering droop method","authors":"Y. R. Rodrigues, M. F. Zambroni de Souza, A. C. Zambroni de Souza, B. I. Lima Lopes, D. Q. Oliveira","doi":"10.1109/PESGM.2016.7741753","DOIUrl":null,"url":null,"abstract":"Power systems are under a huge transformation because of the growing penetration of renewable sources. In this sense, microgrids may become a reality, since local sources and manageable loads and batteries may help the system to be self-sustainable under emergency conditions. This paper proposes a three phase power flow for microgrids which considers the droop method. Hence, frequency and voltage level at the sources may vary. The proposed approach is tested with the help of a modified IEEE 34 test system.","PeriodicalId":155315,"journal":{"name":"2016 IEEE Power and Energy Society General Meeting (PESGM)","volume":"83 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-07-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE Power and Energy Society General Meeting (PESGM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/PESGM.2016.7741753","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 8
Abstract
Power systems are under a huge transformation because of the growing penetration of renewable sources. In this sense, microgrids may become a reality, since local sources and manageable loads and batteries may help the system to be self-sustainable under emergency conditions. This paper proposes a three phase power flow for microgrids which considers the droop method. Hence, frequency and voltage level at the sources may vary. The proposed approach is tested with the help of a modified IEEE 34 test system.
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