Determination of the propagation constant of coupled lines on chips based on high frequency measurements

T. Winkel, L. S. Dutta, H. Grabinski, E. Groteluschen
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引用次数: 26

Abstract

A new method has been developed to determine the propagation constant of symmetrical coupled lossy lines. The results are based on high frequency measurements of the scattering parameters of only two coupled two line systems of different lengths. The mathematical derivation of the method is be given. The proposed method is related to an eigenvalue calculation. Results obtained from measurements are presented and discussed. A comparison between the measured and calculated results is given and shows excellent agreement.
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基于高频测量的芯片上耦合线传播常数的测定
提出了一种确定对称耦合损耗线传播常数的新方法。这些结果是基于对两个不同长度的耦合两线系统的散射参数进行高频测量得出的。给出了该方法的数学推导。该方法与特征值计算有关。给出并讨论了测量结果。对实测结果与计算结果进行了比较,结果吻合良好。
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