Complementary Fault Models for Assessing the Effectiveness of Hamming Codes

Jonas Van Waes, J. Vankeirsbilck, Jonas Lannoo, D. Vanoost, D. Pissoort, J. Boydens
{"title":"Complementary Fault Models for Assessing the Effectiveness of Hamming Codes","authors":"Jonas Van Waes, J. Vankeirsbilck, Jonas Lannoo, D. Vanoost, D. Pissoort, J. Boydens","doi":"10.1109/ET.2019.8878632","DOIUrl":null,"url":null,"abstract":"Communication channels have always been errorprone. To counteract these transmission errors, Error Detection and Correction Codes have been used for a long time. To test the effectiveness of these codes, different fault models can be used. This paper presents two fault models: a systematic fault injection model and an EMI fault model. Both models resemble different kinds of disturbance sources, such as thermal noise, degrading components or electromagnetic interference. By combining both models, as is the aim of this paper, a comprehensive study on the vulnerabilities within a communication channel can be made.","PeriodicalId":306452,"journal":{"name":"2019 IEEE XXVIII International Scientific Conference Electronics (ET)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2019-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 IEEE XXVIII International Scientific Conference Electronics (ET)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ET.2019.8878632","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 6

Abstract

Communication channels have always been errorprone. To counteract these transmission errors, Error Detection and Correction Codes have been used for a long time. To test the effectiveness of these codes, different fault models can be used. This paper presents two fault models: a systematic fault injection model and an EMI fault model. Both models resemble different kinds of disturbance sources, such as thermal noise, degrading components or electromagnetic interference. By combining both models, as is the aim of this paper, a comprehensive study on the vulnerabilities within a communication channel can be made.
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评估汉明码有效性的互补故障模型
沟通渠道总是容易出错。为了抵消这些传输错误,错误检测和纠错码已经被使用了很长时间。为了测试这些代码的有效性,可以使用不同的故障模型。提出了两种故障模型:系统故障注入模型和电磁干扰故障模型。这两种模型模拟了不同类型的干扰源,如热噪声、退化元件或电磁干扰。结合这两种模型,可以对通信通道内的漏洞进行全面的研究,这也是本文的目的。
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