Application of blind method to phase-shifting lithography

H. Jinbo, Y. Yamashita
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引用次数: 2

Abstract

A blind mask and a simplified-blind (S-blind) mask proposed for phase shifting lithography are discussed. They both have very simple structures. Both the blind and S-blind methods are very effective in solving the bridging problem in single-layer-shifter phase-shifting lithography. These phase-shifting methods are suitable for 0.3- mu m lithography for the manufacture of 64-Mb DRAMs.<>
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盲法在移相光刻中的应用
讨论了一种用于相移光刻的盲掩模和一种简化盲掩模。它们的结构都很简单。盲法和s盲法都是解决单层移相器移相光刻中的桥接问题的有效方法。这些移相方法适用于制造64 mb dram的0.3 μ m光刻。
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