{"title":"Analysis and a Reduction Method of Temporal Noise in the CMOS Image Sensor Readout Chain","authors":"Jingwei Wei, Dongmei Li, Jingxuan Qiao, Lixin Zhao","doi":"10.1109/CICTA.2018.8705719","DOIUrl":null,"url":null,"abstract":"This paper analyzes temporal noise in the CMOS image sensor readout chain. The impact of column capacitors on input-referred noise is discussed as the column capacitors make a major contribution to the area of column circuits. Based on the analysis, a new low-noise design method for CMOS image sensors of cellphones is proposed. By implementing MOM capacitors in the pixel array, the area of column readout circuits is effectively reduced.","PeriodicalId":186840,"journal":{"name":"2018 IEEE International Conference on Integrated Circuits, Technologies and Applications (ICTA)","volume":"40 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE International Conference on Integrated Circuits, Technologies and Applications (ICTA)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CICTA.2018.8705719","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
This paper analyzes temporal noise in the CMOS image sensor readout chain. The impact of column capacitors on input-referred noise is discussed as the column capacitors make a major contribution to the area of column circuits. Based on the analysis, a new low-noise design method for CMOS image sensors of cellphones is proposed. By implementing MOM capacitors in the pixel array, the area of column readout circuits is effectively reduced.
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