SETTOFF: A fault tolerant flip-flop for building Cost-efficient Reliable Systems

Yang Lin, Mark Zwolinski
{"title":"SETTOFF: A fault tolerant flip-flop for building Cost-efficient Reliable Systems","authors":"Yang Lin, Mark Zwolinski","doi":"10.1109/IOLTS.2012.6313833","DOIUrl":null,"url":null,"abstract":"Conventional fault tolerance techniques either require big overheads or have limited reliability. We propose a novel fault tolerant flip-flop (SETTOFF) that addresses timing errors and soft errors in one cost-efficient architecture. In SETTOFF, most SEUs are detected by monitoring the illegal transitions at the output of a flip-flop and recovered by inverting the cell state. SETs, timing errors and the other SEUs are detected by a time redundancy-based architecture. For a 10% activity rate, SETTOFF consumes 35.8% and 39.7% more power than a library flip-flop in 120nm and 65nm technologies, respectively. It only consumes about 5.7% more power than the detection based RazorII flip-flop [1]. SETTOFF therefore provides an increased coverage of fault tolerance with only moderate increase in overhead, hence it is suitable for building highly reliable systems at lower cost than the traditional techniques.","PeriodicalId":246222,"journal":{"name":"2012 IEEE 18th International On-Line Testing Symposium (IOLTS)","volume":"20 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-06-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"12","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 IEEE 18th International On-Line Testing Symposium (IOLTS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IOLTS.2012.6313833","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 12

Abstract

Conventional fault tolerance techniques either require big overheads or have limited reliability. We propose a novel fault tolerant flip-flop (SETTOFF) that addresses timing errors and soft errors in one cost-efficient architecture. In SETTOFF, most SEUs are detected by monitoring the illegal transitions at the output of a flip-flop and recovered by inverting the cell state. SETs, timing errors and the other SEUs are detected by a time redundancy-based architecture. For a 10% activity rate, SETTOFF consumes 35.8% and 39.7% more power than a library flip-flop in 120nm and 65nm technologies, respectively. It only consumes about 5.7% more power than the detection based RazorII flip-flop [1]. SETTOFF therefore provides an increased coverage of fault tolerance with only moderate increase in overhead, hence it is suitable for building highly reliable systems at lower cost than the traditional techniques.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
设置:一种容错触发器,用于构建成本效益高的可靠系统
传统的容错技术要么需要很大的开销,要么可靠性有限。我们提出了一种新的容错触发器(SETTOFF),它在一个经济高效的架构中解决了定时错误和软错误。在SETTOFF中,大多数seu是通过监视触发器输出端的非法转换来检测的,并通过反转单元状态来恢复。set、定时错误和其他seu由基于时间冗余的体系结构检测。对于10%的活动率,SETTOFF比120nm和65nm技术的库触发器分别消耗35.8%和39.7%的功率。它只比基于检测的RazorII触发器多消耗约5.7%的功率[1]。因此,SETTOFF提供了增加的容错覆盖范围,而开销仅适度增加,因此它适用于以比传统技术更低的成本构建高可靠性系统。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Analysis of FinFET technology on memories Fault missing rate analysis of the arithmetic residue codes based fault-tolerant FIR filter design Fault coverage of a timing and control flow checker for hard real-time systems Architectural vulnerability aware checkpoint placement in a multicore processor A real-case application of a synergetic design-flow-oriented SER analysis
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1