Solving an EMC/EMI problem occurred inside a complex programmable logic device

D. Vuza, M. Vlădescu
{"title":"Solving an EMC/EMI problem occurred inside a complex programmable logic device","authors":"D. Vuza, M. Vlădescu","doi":"10.1109/ISSE.2014.6887631","DOIUrl":null,"url":null,"abstract":"During the development of an electronic module using a complex programmable logic device (CPLD) and a micro-controller, we noticed an abnormal behavior of the CPLD manifested as an unexpected reset of a counter. We identified a synchronous perturbation and an asynchronous perturbation as being responsible for the disturbance, both of them being related to the change in the state of a large number of data lines. We devised and tested methods for eliminating both perturbations, the application of which helped in achieving the intended behavior of the device.","PeriodicalId":375711,"journal":{"name":"Proceedings of the 2014 37th International Spring Seminar on Electronics Technology","volume":"16 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-05-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 2014 37th International Spring Seminar on Electronics Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISSE.2014.6887631","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

During the development of an electronic module using a complex programmable logic device (CPLD) and a micro-controller, we noticed an abnormal behavior of the CPLD manifested as an unexpected reset of a counter. We identified a synchronous perturbation and an asynchronous perturbation as being responsible for the disturbance, both of them being related to the change in the state of a large number of data lines. We devised and tested methods for eliminating both perturbations, the application of which helped in achieving the intended behavior of the device.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
解决一个复杂的可编程逻辑器件内部发生的EMC/EMI问题
在使用复杂可编程逻辑器件(CPLD)和微控制器的电子模块的开发过程中,我们注意到CPLD的异常行为表现为计数器意外复位。我们确定了同步扰动和异步扰动是造成扰动的原因,它们都与大量数据线状态的变化有关。我们设计并测试了消除这两种扰动的方法,其应用有助于实现设备的预期行为。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Employing model based failure mode and effect analysis for screen printing Evaluation of long time stability of solder joints on Ag thick film conductors on Al2O3 Investigation of electrical properties of contacts made of materials based on sintered nano-Ag particles Nanosilver sintered joints on elastic substrates Stability of LTCC substrates in high frequency area after accelerated aging tests
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1