Evaluation of resistance of ECC designs protected by different randomization countermeasures against horizontal DPA attacks

I. Kabin, Z. Dyka, D. Kreiser, P. Langendörfer
{"title":"Evaluation of resistance of ECC designs protected by different randomization countermeasures against horizontal DPA attacks","authors":"I. Kabin, Z. Dyka, D. Kreiser, P. Langendörfer","doi":"10.1109/EWDTS.2017.8110037","DOIUrl":null,"url":null,"abstract":"In this paper we investigate how different randomization approaches influence the success of horizontal DPA attacks. We use our own ECC design to run the experiments. We applied the following randomization techniques: EC point blinding, key randomization and a combination of both. Our experiments demonstrate the fact that these well-known randomizations of processed data are not effective against horizontal DPA attacks. In addition we investigated randomized calculation sequences of partial multiplications, i.e. a kind of intermediate data randomization, as potential countermeasures. We simulated power traces of elliptic curve point multiplication kP for all applied countermeasures and performed our low-cost horizontal DPA attack. We applied a difference of means test to reveal the scalar k. Our experiments show that the randomization of the processing sequence of the partial multiplications improves the resistance of the design against horizontal attacks significantly but is not sufficient as the only means against DPA attacks.","PeriodicalId":141333,"journal":{"name":"2017 IEEE East-West Design & Test Symposium (EWDTS)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 IEEE East-West Design & Test Symposium (EWDTS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EWDTS.2017.8110037","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 8

Abstract

In this paper we investigate how different randomization approaches influence the success of horizontal DPA attacks. We use our own ECC design to run the experiments. We applied the following randomization techniques: EC point blinding, key randomization and a combination of both. Our experiments demonstrate the fact that these well-known randomizations of processed data are not effective against horizontal DPA attacks. In addition we investigated randomized calculation sequences of partial multiplications, i.e. a kind of intermediate data randomization, as potential countermeasures. We simulated power traces of elliptic curve point multiplication kP for all applied countermeasures and performed our low-cost horizontal DPA attack. We applied a difference of means test to reveal the scalar k. Our experiments show that the randomization of the processing sequence of the partial multiplications improves the resistance of the design against horizontal attacks significantly but is not sufficient as the only means against DPA attacks.
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评价不同随机化对策保护的ECC设计对水平DPA攻击的抵抗能力
在本文中,我们研究了不同的随机化方法如何影响水平DPA攻击的成功。我们使用自己的ECC设计来运行实验。我们应用了以下随机化技术:EC点盲、关键随机化和两者的结合。我们的实验证明,这些众所周知的处理数据的随机化对水平DPA攻击无效。此外,我们还研究了部分乘法的随机化计算序列,即一种中间数据随机化,作为潜在的对策。我们模拟了所有应用对策的椭圆曲线点乘法kP的功率轨迹,并执行了我们的低成本水平DPA攻击。我们应用均值差异检验来揭示标量k。我们的实验表明,部分乘法处理顺序的随机化显著提高了设计对水平攻击的抵抗力,但不足以作为对抗DPA攻击的唯一手段。
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