D. Crestani, A. Aguila, M. Gentil, P. Chardon, C. Durante
{"title":"Automatic partitioning for deterministic test","authors":"D. Crestani, A. Aguila, M. Gentil, P. Chardon, C. Durante","doi":"10.1109/EURDAC.1992.246224","DOIUrl":null,"url":null,"abstract":"Automatic partitioning for digital circuits is proposed. The partitions are defined by using functional testability measures and a test difficulty estimation. The software, developed with an expert system generator, is embedded in a hierarchical test generation process. The partitioning technique proposed uses difficulty test estimation corresponding to the maximal number of logical gates that can be embedded in a given partition. This parameter represents the maximal number of gates that can be handled by the tool.<<ETX>>","PeriodicalId":218056,"journal":{"name":"Proceedings EURO-DAC '92: European Design Automation Conference","volume":"18 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings EURO-DAC '92: European Design Automation Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EURDAC.1992.246224","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
Automatic partitioning for digital circuits is proposed. The partitions are defined by using functional testability measures and a test difficulty estimation. The software, developed with an expert system generator, is embedded in a hierarchical test generation process. The partitioning technique proposed uses difficulty test estimation corresponding to the maximal number of logical gates that can be embedded in a given partition. This parameter represents the maximal number of gates that can be handled by the tool.<>
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