SMFL Integrating Spectrum and Mutation for Fault Localization

Abstract

At present, spectrum-based fault localization and mutation-based fault localization are the most popular fault localization methods. The two methods suffer from the problems that multiple statements are ranked the same and there are high time costs. To improve the performance of fault localization, this paper proposes a novel approach for fault localization based on integrating spectrum and mutation. In addition to decreasing the time consumption overhead of the mutation-based fault localization method, the approach improves the accuracy of the spectrum-based fault localization method. The experimental results show that the approach improves the accuracy of fault localization in comparison with the spectrum-based fault localization method.