Y. Niki, D. Miyashita, Hiroyuki Kobayashi, S. Kousai
{"title":"A supply-noise-rejection technique in ADPLL with noise-cancelling current source","authors":"Y. Niki, D. Miyashita, Hiroyuki Kobayashi, S. Kousai","doi":"10.1109/ESSCIRC.2013.6649068","DOIUrl":null,"url":null,"abstract":"We propose a supply noise rejection technique, which is applied to an all-digital phase-locked loop (ADPLL). Supply noise is cancelled by adding a cancellation current whose fluctuation is the same as that of a supply-noise component in an oscillator current. The proposed technique is realized with a small area and current dissipation, and is tolerant to process, voltage, and temperature (PVT) variations without calibration. The proof-of-concept chip was fabricated using a 65 nm CMOS technology. It was measured that the peak-to-peak jitter was reduced by 54 % in the presence of 30 mVpp, 15 MHz supply noise, and the robustness of the proposed technique was verified by the measurements.","PeriodicalId":183620,"journal":{"name":"2013 Proceedings of the ESSCIRC (ESSCIRC)","volume":"13 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-10-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 Proceedings of the ESSCIRC (ESSCIRC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ESSCIRC.2013.6649068","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
We propose a supply noise rejection technique, which is applied to an all-digital phase-locked loop (ADPLL). Supply noise is cancelled by adding a cancellation current whose fluctuation is the same as that of a supply-noise component in an oscillator current. The proposed technique is realized with a small area and current dissipation, and is tolerant to process, voltage, and temperature (PVT) variations without calibration. The proof-of-concept chip was fabricated using a 65 nm CMOS technology. It was measured that the peak-to-peak jitter was reduced by 54 % in the presence of 30 mVpp, 15 MHz supply noise, and the robustness of the proposed technique was verified by the measurements.