Electrical failure of multilayer ceramic capacitors caused by high temperature and high humidity environment

1994 Proceedings. 44th Electronic Components and Technology Conference Pub Date : 1994-05-01 DOI:10.1109/ECTC.1994.367529

F. Yeung, Y. Chan

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引用次数: 13

Abstract

In this paper, the electrical behavior of multilayer ceramic capacitors (MLCs) in strict dynamic high temperature-humidity-DC bias voltage (THB) conditions were studied and the failure model of MLCs under such conditions was proposed. It was found, if the environmental temperature and humidity rose too fast and the temperature of a MLC was lower than the dew point temperature of surrounding moist air, dewdrops would condense on the MLC surface. When DC voltage was applied, metallic ions from end terminations of the MLC would migrate along the condensed water film on the MLC surface and made a permanent short-circuiting path between two terminations. Silver and tin migrations were found by EDX detection in our experiment. It was also found that the applied DC electrical loading level had a strong influence on the fail rate of MLCs. The recovery rate of MLCs after the dynamic THB process decreased with applied DC voltage increasing. To reduce the effect of dewdrops of moist air on the reliability of MLCs, the method and speed of temperature and humidity rise are discussed.<>

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高温高湿环境下多层陶瓷电容器的电气故障

本文研究了多层陶瓷电容器(MLCs)在严格的动态高温-湿-直流偏置电压(THB)条件下的电学行为，并提出了多层陶瓷电容器在这种条件下的失效模型。研究发现，如果环境温度和湿度上升过快，且MLC的温度低于周围潮湿空气的露点温度，则MLC表面会凝结露珠。当施加直流电压时，来自MLC末端的金属离子会沿着MLC表面的冷凝水膜迁移，并在两个末端之间形成永久短路路径。在我们的实验中，用EDX检测发现银和锡的迁移。研究还发现，施加的直流电负荷水平对mlc的故障率有很大的影响。动态THB处理后的MLCs回收率随外加直流电压的升高而降低。为了降低湿空气露珠对mlc可靠性的影响，讨论了温湿上升的方法和速度。

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1994 Proceedings. 44th Electronic Components and Technology Conference

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