Verilog-A modeling of filamentary-based complementary resistance switching devices

T. Kalkur, M. Pawlikiewicz
{"title":"Verilog-A modeling of filamentary-based complementary resistance switching devices","authors":"T. Kalkur, M. Pawlikiewicz","doi":"10.1109/NANO.2018.8626380","DOIUrl":null,"url":null,"abstract":"This paper presents a compact model implemented in Verilog-A for complementary resistive switching (CRS) devices based on nickel oxide (NiO). Device characterization enabled the creation and enhancement of the model for the complementary resistive switching RRAM including temperature dependence which is implemented in Verilog- A and could be used in circuit simulators for design of RRAM memory circuits.","PeriodicalId":425521,"journal":{"name":"2018 IEEE 18th International Conference on Nanotechnology (IEEE-NANO)","volume":"101 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE 18th International Conference on Nanotechnology (IEEE-NANO)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NANO.2018.8626380","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

Abstract

This paper presents a compact model implemented in Verilog-A for complementary resistive switching (CRS) devices based on nickel oxide (NiO). Device characterization enabled the creation and enhancement of the model for the complementary resistive switching RRAM including temperature dependence which is implemented in Verilog- A and could be used in circuit simulators for design of RRAM memory circuits.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
基于细丝的互补电阻开关器件的Verilog-A建模
本文提出了一个在Verilog-A中实现的基于氧化镍(NiO)的互补电阻开关(CRS)器件的紧凑模型。器件特性使互补电阻开关RRAM模型的创建和增强成为可能,包括在Verilog- A中实现的温度依赖,并可用于RRAM存储电路设计的电路模拟器。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Monolithic Integration of III-V on Si Applied to Lasing Micro-Cavities: Insights from STEM and EDX Characterisation of Electroless Deposited Cobalt by Hard and Soft X-ray Photoemission Spectroscopy Multiscale simulation of nanostructured devices Modeling of a Stacked Gated Nanofluidic Channel Metamaterial-Based Label-Free Chemical Sensors for the Detection of Volatile Organic Solutions
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1