{"title":"A model for impulsive EMI effects caused by low voltage ESD","authors":"M. Honda","doi":"10.1109/IAS.1993.299099","DOIUrl":null,"url":null,"abstract":"A model for impulsive electromagnetic interference (EMI) effects caused by relatively low-voltage electrostatic discharge (ESD) on digital electronic systems is proposed. The power of impulsive EMI is governed by the product of the following three parameters: charged voltage, rise time of the discharge current, and susceptibility of the system.<<ETX>>","PeriodicalId":345027,"journal":{"name":"Conference Record of the 1993 IEEE Industry Applications Conference Twenty-Eighth IAS Annual Meeting","volume":"32 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Conference Record of the 1993 IEEE Industry Applications Conference Twenty-Eighth IAS Annual Meeting","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IAS.1993.299099","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
A model for impulsive electromagnetic interference (EMI) effects caused by relatively low-voltage electrostatic discharge (ESD) on digital electronic systems is proposed. The power of impulsive EMI is governed by the product of the following three parameters: charged voltage, rise time of the discharge current, and susceptibility of the system.<>
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