Deterministic deployment of in-plane silicon nanowires for high performance large area electronics

Han Yin, Xiaoxiang Wu, Jun Xu, Kunji Chen, Linwei Yu
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Abstract

One-dimensional (1D) nanostructures, such as semiconductor nanowires (NWs), nanobelts (NBs), and carbon nanotubes (CNTs), could be of ideal building blocks for electronic devices and might extend the remarkably successful scaling of microelectronics industry [3–6]. While the benefits of fin-gate field effective transistors (FET) have been very well established and implemented in micro-electronics, the same quasi-1D nano channel (diameter $\lt100$ nm) technology is hard to apply in large area electronics where the resolution of lithography is only 2 or 3 um. Self-assembly growth mediated by nano metal droplets can offer a low cost and high throughput solution to manufacture of tiny crystalline silicon nanowires (SiNWs). However, a precise location and orientation control of the self-assembly SiNWs over large area are still difficult to achieve with the common vapor-liquid-solid (VLS) growth mechanism. In this work, we will introduce a new in-plane solid-liquid-solid (IPSLS) growth, [1] which enables a precise growth routine and geometry controls over the self-assembly SiNWs. During an IPSLS growth, an amorphous Si (a-Si) thin film is used as the precursor layer that is absorbed by nano droplets of indium (In) to move laterally and produce continuous crystalline SiNWs behind. This growth can be activated at a rather low temperature $\lt 350$ °C in conventional PECVD system. Based on this unique capability, orderly crystalline SiNW channels can be easily manufactured over glass substrate, providing a key basis to fabricate high mobility fin-like thin film transistors (TFTs) for large area and high resolution display. Initial integration of the in-plane SiNWs for Fin-FETs has demonstrated a high hole mobility of $\gt150$ cm2V–1s–1, high on/off ratio $\gt 10^{6}$ and excellent subthreshold swing of only 120 mV/dec, via a low temperature procedure fully compatible to a-Si TFT technology. More importantly, thanks to a precise position and compositional controls over the tiny SiNWs [2–6], primitive logics can be constructed over the SiNW channels. Finally, a programmable geometry and line-shape engineering of the in-plane SiNWs will be showcased, which enables a reliable and low-cost fabrication of highly stretchable c-Si nano springs for high performance flexible and stretchable electronics. The SiNW logic device performance and the key control parameters of this IPSLS growth strategy, as well as its unique potentials in advanced 3D microelectronics, will be addressed.
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面向高性能大面积电子器件的面内硅纳米线的确定性部署
一维(1D)纳米结构,如半导体纳米线(NWs)、纳米带(NBs)和碳纳米管(CNTs),可能是电子器件的理想构建模块,并可能扩展微电子工业的显著成功规模[3-6]。虽然鳍门场有效晶体管(FET)的优势已经在微电子领域得到了很好的建立和实现,但同样的准一维纳米通道(直径$\lt100$ nm)技术很难应用于光刻分辨率仅为2或3um的大面积电子领域。纳米金属液滴介导的自组装生长为微晶硅纳米线的制备提供了低成本、高通量的解决方案。然而,在常见的气液固生长机制下,自组装SiNWs在大面积上的精确定位和取向控制仍然难以实现。在这项工作中,我们将介绍一种新的平面内固体-液体-固体(IPSLS)生长[1],它可以实现精确的生长程序和对自组装sinw的几何控制。在IPSLS生长过程中,使用非晶硅(a-Si)薄膜作为前驱体层,该前驱体层被铟(In)纳米液滴吸收并横向移动,并在后面产生连续的结晶SiNWs。在传统的PECVD系统中,这种生长可以在相当低的温度下激活,例如350°C。基于这种独特的能力,有序的晶体SiNW通道可以很容易地在玻璃衬底上制造,为制造高迁移率的鳍状薄膜晶体管(tft)提供了关键基础,用于大面积和高分辨率显示。通过与a- si TFT技术完全兼容的低温工艺,fin - fet的面内sinw的初始集成证明了高空穴迁移率$ $ gt150$ cm2V-1s-1,高开/关比$ $ gt10 ^{6}$和出色的亚阈值摆幅仅为120 mV/dec。更重要的是,由于对微小SiNW的精确位置和组合控制[2-6],原始逻辑可以在SiNW通道上构建。最后,将展示平面内sinw的可编程几何形状和线形工程,从而实现高可拉伸c-Si纳米弹簧的可靠和低成本制造,用于高性能柔性和可拉伸电子产品。将讨论SiNW逻辑器件的性能和IPSLS增长战略的关键控制参数,以及其在先进3D微电子领域的独特潜力。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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