Decompression hardware determination for test volume and time reduction through unified test pattern compaction and compression

I. Bayraktaroglu, A. Orailoglu
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引用次数: 62

Abstract

A methodology for the determination of decompression hardware that guarantees complete fault coverage for a unified compaction/compression scheme is proposed. Test cube information is utilized for the determination of a near optimal decompression hardware. The proposed scheme attains simultaneously high compression levels and reduced pattern counts through a linear decompression hardware. Significant test volume and test application time reductions are delivered through the scheme we propose while a highly cost effective hardware implementation is retained.
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通过统一的测试模式压缩和压缩来减少测试体积和时间的解压硬件确定
提出了一种确定解压硬件的方法,该方法保证了统一压缩/压缩方案的完全故障覆盖。测试多维数据集信息用于确定接近最优的解压缩硬件。该方案通过线性解压缩硬件实现高压缩水平和减少模式数的同时实现。通过我们提出的方案,显著减少了测试量和测试应用时间,同时保留了高成本效益的硬件实现。
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