Dynamic Stress of Solder Joints under Board-Level Drop/Impact

Jie Bai, F. Qin, Tong An
{"title":"Dynamic Stress of Solder Joints under Board-Level Drop/Impact","authors":"Jie Bai, F. Qin, Tong An","doi":"10.1109/ICEPT.2007.4441407","DOIUrl":null,"url":null,"abstract":"A 3-D finite element model of board level BGA package was built and the Input-G method was used to analyze dynamic solder joint stress in the package during drop/impact. Boundary condition, bolt effects of the test board and peeling stress mechanism were emphasized in current investigation. Dynamic responses of solder joint in frequency domain and time domain were analyzed to find main mechanism of stress generation. The results show that bolt constraints have a significant influence on the dynamic stress in solder joints. The bolt constraints must be treated as zero horizontal displacement in the area the bolt acted in the numerical model. The stress in the solder joint reaches its peak at 0.4ms and the maximum peeling stress is located at the most outer corner of the package. The peeling stress is dominated by the deflection of the PCB board. Due to effect of the 5th vibrating mode, the stress-time curve of the solder joints is not smooth.","PeriodicalId":325619,"journal":{"name":"2007 8th International Conference on Electronic Packaging Technology","volume":"34 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 8th International Conference on Electronic Packaging Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICEPT.2007.4441407","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

Abstract

A 3-D finite element model of board level BGA package was built and the Input-G method was used to analyze dynamic solder joint stress in the package during drop/impact. Boundary condition, bolt effects of the test board and peeling stress mechanism were emphasized in current investigation. Dynamic responses of solder joint in frequency domain and time domain were analyzed to find main mechanism of stress generation. The results show that bolt constraints have a significant influence on the dynamic stress in solder joints. The bolt constraints must be treated as zero horizontal displacement in the area the bolt acted in the numerical model. The stress in the solder joint reaches its peak at 0.4ms and the maximum peeling stress is located at the most outer corner of the package. The peeling stress is dominated by the deflection of the PCB board. Due to effect of the 5th vibrating mode, the stress-time curve of the solder joints is not smooth.
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焊点在板级跌落/冲击下的动态应力
建立了板级BGA封装的三维有限元模型,采用Input-G法分析了跌落/冲击过程中封装内焊点的动态应力。目前的研究重点是边界条件、试验板的锚杆效应和剥离应力机制。对焊点的频域和时域动态响应进行了分析,找出了应力产生的主要机理。结果表明,螺栓约束对焊点动应力有显著影响。在数值模型中,锚杆约束必须被视为在锚杆作用区域内水平位移为零。焊点应力在0.4ms处达到峰值,最大剥落应力位于封装最外角处。剥离应力主要由PCB板的挠曲引起。由于第5振动模式的影响,焊点的应力-时间曲线并不光滑。
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