{"title":"Skew and EMI management in differential microstrip lines up to 15GHz","authors":"M. Burford, P. Levin, T. Kazmierski","doi":"10.1109/SPI.2007.4512247","DOIUrl":null,"url":null,"abstract":"The use of current methods of length matching in differential microstrip transmission lines when used with data-rates up to 15 GHz is explored. It is shown that using current methods of length matching could make worse mode conversion and EM loss than with no length matching at all. A new method is suggested whereby interconnect geometry can be engineered to match the length of a pair at a specific or dominant frequency, while also minimizing reflections. This is achieved through appropriate engineering of de-skew wiglets, variation of their positioning, geometry and number.","PeriodicalId":206352,"journal":{"name":"2007 IEEE Workshop on Signal Propagation on Interconnects","volume":"103 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-05-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 IEEE Workshop on Signal Propagation on Interconnects","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SPI.2007.4512247","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 6
Abstract
The use of current methods of length matching in differential microstrip transmission lines when used with data-rates up to 15 GHz is explored. It is shown that using current methods of length matching could make worse mode conversion and EM loss than with no length matching at all. A new method is suggested whereby interconnect geometry can be engineered to match the length of a pair at a specific or dominant frequency, while also minimizing reflections. This is achieved through appropriate engineering of de-skew wiglets, variation of their positioning, geometry and number.