On the functional test of L2 caches

Michele Riga, E. Sánchez, M. Reorda
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引用次数: 5

Abstract

Caches are crucial components in today's processors (both stand-alone or integrated into SoCs) and they account for a growing percentage of the occupied silicon area. Therefore, their test (both at the end of the manufacturing and on-line) is crucial for the quality and reliability of the whole product. While in many cases cache test is based on Design for Testability (DfT) techniques, there are situations in which the functional approach is the only viable one. Previous papers addressed the issue of developing test programs for testing caches: since the constant trend is to organize them in different levels, in this paper we address the test of second level caches (L2). To the best of our knowledge, the paper presents the first functional test method for L2 caches: some experimental results also are provided to assess its effectiveness on the OpenSPARC T1 processor.
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关于二级缓存的功能测试
缓存是当今处理器(无论是独立的还是集成到soc中的)的关键组件,它们所占的硅面积比例越来越大。因此,他们的测试(在制造结束和在线)对整个产品的质量和可靠性至关重要。虽然在许多情况下,缓存测试是基于可测试性设计(DfT)技术,但在某些情况下,功能方法是唯一可行的方法。以前的论文讨论了为测试缓存开发测试程序的问题:由于不断的趋势是将它们组织在不同的级别,在本文中,我们讨论了二级缓存(L2)的测试。据我们所知,本文提出了L2缓存的第一个功能测试方法,并提供了一些实验结果来评估其在OpenSPARC T1处理器上的有效性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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