Defect coverage of non-intrusive board tests (NBT): What does it mean when a non-intrusive board test passes?

Adam W. Ley
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引用次数: 3

Abstract

Non-intrusive board test (NBT) [1] is an emerging test methodology that integrates several complementary test technologies to restore test coverage lost due to diminishing physical (probe) access to printed circuit boards. While NBT boundary-scan test provides a core capability for structural test (e.g., shorts & opens), NBT processor-controlled test adds an element of functional test (e.g., at-speed operation) and NBT built-in self test delivers performance test (e.g., on-margin operation). A framework to consider the overall test coverage in these multiple dimensions is required to assess the full impact of the test strategy.
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非侵入性板测试(NBT)的缺陷覆盖率:当非侵入性板测试通过时意味着什么?
非侵入式电路板测试(NBT)[1]是一种新兴的测试方法,它集成了几种互补的测试技术,以恢复由于减少对印刷电路板的物理(探针)访问而丢失的测试覆盖率。NBT边界扫描测试提供了结构测试的核心能力(例如,短路和打开),NBT处理器控制测试增加了功能测试的元素(例如,高速运行),NBT内置自检提供了性能测试(例如,边际运行)。需要一个框架来考虑这些多维度中的总体测试覆盖率,以评估测试策略的全部影响。
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