Thin body GaSb-OI P-mosfets on Si wafers fabricated by direct wafer bonding

K. Nishi, M. Yokoyama, H. Yokoyama, M. Takenaka, S. Takagi
{"title":"Thin body GaSb-OI P-mosfets on Si wafers fabricated by direct wafer bonding","authors":"K. Nishi, M. Yokoyama, H. Yokoyama, M. Takenaka, S. Takagi","doi":"10.1109/ICIPRM.2014.6880566","DOIUrl":null,"url":null,"abstract":"We have demonstrated the operation of thin body GaSb-on-insulator (GaSb-OI) p-MOSFETs on Si wafers fabricated by direct wafer boding (DWB). We have developed a wafer-scale transfer technique for transferring ultrathin GaSb layers to Si wafers. We have found that the hole mobility of the thin body GaSb-OI p-MOSFETs depends on the GaSb thickness and the GaSb channel surface condition.","PeriodicalId":181494,"journal":{"name":"26th International Conference on Indium Phosphide and Related Materials (IPRM)","volume":"11 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-05-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"26th International Conference on Indium Phosphide and Related Materials (IPRM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICIPRM.2014.6880566","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

Abstract

We have demonstrated the operation of thin body GaSb-on-insulator (GaSb-OI) p-MOSFETs on Si wafers fabricated by direct wafer boding (DWB). We have developed a wafer-scale transfer technique for transferring ultrathin GaSb layers to Si wafers. We have found that the hole mobility of the thin body GaSb-OI p-MOSFETs depends on the GaSb thickness and the GaSb channel surface condition.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
硅片直接键合制备的薄体GaSb-OI - p -mosfet
我们已经演示了薄体绝缘体上gasb (GaSb-OI) p- mosfet在直接晶圆封装(DWB)制造的硅晶圆上的操作。我们开发了一种晶圆级转移技术,用于将超薄GaSb层转移到硅晶圆上。我们发现薄体GaSb- oi p- mosfet的空穴迁移率取决于GaSb厚度和GaSb通道表面条件。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Ion implanted In0.53Ga0.47As for ultrafast saturable absorber device at 1.55 μm Waveguide InGaAs photodetector with schottky barrier enhancement layer on III-V CMOS photonics platform Frequency increase in resonant-tunneling-diode terahertz oscillators using optimum collector spacer Refractive index of In1−xGaxAsyP1−y lattice-matched to InP in IR-transparent and absorption region Microfocus HRXRD analysis of inp based photonic integrated circuits
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1