{"title":"Novel Bi-partitioned Scan Architecture to Improve Transition Fault Coverage","authors":"V. Devanathan","doi":"10.1109/ATS.2005.82","DOIUrl":null,"url":null,"abstract":"In very deep submicron era, high transition fault coverage is crucial to ensure low levels of Defective Parts Per Million(DPPM). In this paper, the role of bi-partitioning a netlist for transition fault test is analyzed and novel bi-partitioned scan architectures are proposed to improve transition fault coverage with slow speed scan enable. Experiments on 5 industrial ASIC designs show a consistent increase in transition fault coverage.","PeriodicalId":373563,"journal":{"name":"14th Asian Test Symposium (ATS'05)","volume":"21 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2005-12-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"14th Asian Test Symposium (ATS'05)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS.2005.82","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
In very deep submicron era, high transition fault coverage is crucial to ensure low levels of Defective Parts Per Million(DPPM). In this paper, the role of bi-partitioning a netlist for transition fault test is analyzed and novel bi-partitioned scan architectures are proposed to improve transition fault coverage with slow speed scan enable. Experiments on 5 industrial ASIC designs show a consistent increase in transition fault coverage.
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