Test Efficiency Analysis and Improvement of SOC Test Platforms

Tong-Yu Hsieh, Kuen-Jong Lee, Jianyu You
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引用次数: 4

Abstract

Employing a test platform in an SOC design has been shown to be an effective method for SOC testing. However the test efficiency problem of a test platform has not been addressed. In this paper, we formally analyze the test efficiency of test platforms and seek for its optimization. We formulate the required numbers of test cycles for test platforms implemented with different test structures and/or executed with different test procedures. It is shown that up to 24X test time difference for platforms with different test structures/procedures is possible. Based on the derived formula, an appropriate test platform that can achieve best test efficiency with minimal area overhead can be determined.
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SOC测试平台的测试效率分析与改进
在SOC设计中采用测试平台已被证明是一种有效的SOC测试方法。然而,测试平台的测试效率问题一直没有得到解决。在本文中,我们正式分析了测试平台的测试效率,并寻求其优化。我们为使用不同测试结构和/或使用不同测试程序执行的测试平台制定所需的测试周期数。结果表明,对于不同测试结构/程序的平台,测试时差可能高达24倍。根据导出的公式,可以确定一个合适的测试平台,以最小的面积开销实现最佳的测试效率。
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