{"title":"How the noise floor affects the production yield","authors":"A. Maeda","doi":"10.1109/ATS.2007.116","DOIUrl":null,"url":null,"abstract":"The noise floor is the noise distributed all of the frequency range and it does not include the spurious. At the test system, GNDs, power supplies and test modules have their own noise floor and the total sum of these noise floors affects the device test. The GND noise floor is hard to deal with because it is common mode noise and it is not easy to remove.","PeriodicalId":289969,"journal":{"name":"16th Asian Test Symposium (ATS 2007)","volume":"9 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-10-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"16th Asian Test Symposium (ATS 2007)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS.2007.116","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
The noise floor is the noise distributed all of the frequency range and it does not include the spurious. At the test system, GNDs, power supplies and test modules have their own noise floor and the total sum of these noise floors affects the device test. The GND noise floor is hard to deal with because it is common mode noise and it is not easy to remove.
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