{"title":"Extended subspace identification of improper linear systems","authors":"G. Vandersteen, R. Pintelon, D. Linten, S. Donnay","doi":"10.1109/DATE.2004.1268888","DOIUrl":null,"url":null,"abstract":"The modeling of linear transfer functions is often required prior to the simulation of electronic systems. An example is the modeling of on-chip inductors starting from 2-port measurements. The modeling is often done using state-space models that can only represent proper systems. This leads to modeling problems in the case of improper systems such as in the case of 2-port modeling of the admittance matrix of an on-chip inductor. This paper first describes an extended state-space model to represent improper systems. Afterwards, the paper introduces an extension to classical frequency-domain subspace identification methods. The usefulness of both the extended state-space model and the extended subspace modeling technique are illustrated by comparing them with commercially available solutions. This includes a comparison on measurements of an on-chip inductor and on simulations of a coplanar waveguide.","PeriodicalId":335658,"journal":{"name":"Proceedings Design, Automation and Test in Europe Conference and Exhibition","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-02-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings Design, Automation and Test in Europe Conference and Exhibition","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DATE.2004.1268888","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
The modeling of linear transfer functions is often required prior to the simulation of electronic systems. An example is the modeling of on-chip inductors starting from 2-port measurements. The modeling is often done using state-space models that can only represent proper systems. This leads to modeling problems in the case of improper systems such as in the case of 2-port modeling of the admittance matrix of an on-chip inductor. This paper first describes an extended state-space model to represent improper systems. Afterwards, the paper introduces an extension to classical frequency-domain subspace identification methods. The usefulness of both the extended state-space model and the extended subspace modeling technique are illustrated by comparing them with commercially available solutions. This includes a comparison on measurements of an on-chip inductor and on simulations of a coplanar waveguide.