N. Browning, D. Nicholls, J. Wells, Alex W Robinson
{"title":"Optimal Sampling and Reconstruction Strategies for Scanning Microscopes","authors":"N. Browning, D. Nicholls, J. Wells, Alex W Robinson","doi":"10.31399/asm.edfa.2022-1.p011","DOIUrl":null,"url":null,"abstract":"\n This article discusses the tradeoffs associated with minimizing beam dose in a scanning transmission electron microscope (STEM) and explains how to reduce beam exposure through subsampling and inpainting, a signal reconstruction technique that optimizes image quality and resolution. Although the method is described in the context of STEM imaging, it applies to any scanned imaging system.","PeriodicalId":431761,"journal":{"name":"EDFA Technical Articles","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2022-02-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"EDFA Technical Articles","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.31399/asm.edfa.2022-1.p011","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract
This article discusses the tradeoffs associated with minimizing beam dose in a scanning transmission electron microscope (STEM) and explains how to reduce beam exposure through subsampling and inpainting, a signal reconstruction technique that optimizes image quality and resolution. Although the method is described in the context of STEM imaging, it applies to any scanned imaging system.
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