Four-Dimensional Scanning Transmission Electron Microscopy: Part II, Crystal Orientation and Phase, Short and Medium Range Order, and Electromagnetic Fields
{"title":"Four-Dimensional Scanning Transmission Electron Microscopy: Part II, Crystal Orientation and Phase, Short and Medium Range Order, and Electromagnetic Fields","authors":"A. Johnston-Peck, A. Herzing","doi":"10.31399/asm.edfa.2024-1.p004","DOIUrl":null,"url":null,"abstract":"\n Four-dimensional scanning transmission electron microscopy (4D-STEM) is a spatially resolved electron diffraction technique that records the electron scattering distribution at each point of the electron beam raster, thereby producing a four-dimensional dataset. This second installment of this series presents applications of 4D-STEM, including measurements of crystal orientation and phase, short- and medium-range order, and internal electromagnetic fields.","PeriodicalId":431761,"journal":{"name":"EDFA Technical Articles","volume":"45 58","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2024-02-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"EDFA Technical Articles","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.31399/asm.edfa.2024-1.p004","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract
Four-dimensional scanning transmission electron microscopy (4D-STEM) is a spatially resolved electron diffraction technique that records the electron scattering distribution at each point of the electron beam raster, thereby producing a four-dimensional dataset. This second installment of this series presents applications of 4D-STEM, including measurements of crystal orientation and phase, short- and medium-range order, and internal electromagnetic fields.
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