Four-Dimensional Scanning Transmission Electron Microscopy: Part II, Crystal Orientation and Phase, Short and Medium Range Order, and Electromagnetic Fields

A. Johnston-Peck, A. Herzing
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Abstract

Four-dimensional scanning transmission electron microscopy (4D-STEM) is a spatially resolved electron diffraction technique that records the electron scattering distribution at each point of the electron beam raster, thereby producing a four-dimensional dataset. This second installment of this series presents applications of 4D-STEM, including measurements of crystal orientation and phase, short- and medium-range order, and internal electromagnetic fields.
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四维扫描透射电子显微镜:第二部分,晶体定向和相位、中短程有序和电磁场
四维扫描透射电子显微镜(4D-STEM)是一种空间分辨电子衍射技术,可记录电子束光栅上每一点的电子散射分布,从而生成四维数据集。本系列的第二部分将介绍 4D-STEM 的应用,包括晶体取向和相位、中短程有序性以及内部电磁场的测量。
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