Estimating purity of Cd, Zn, Pb by non-contact measurement of specific electrical resistance at liquid nitrogen temperature

A. Kondrik, G. Kovtun, О. Shcherban, D. О. Solopikhin
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Abstract

High-purity fusible metals Cd, Zn, Pb and archaeological archPb are used as component elements in semiconductor and low-background scintillation detectors based on CdTe, CdZnTe, CdWO4 PbWO4 , ZnWO4 required for registering ionizing radiation and searching for particles of dark matter, rare alpha and beta decays. The detection efficiency and the sensitivity of detectors significantly depend on the purity of the constituent elements of detector materials. The dependence of the resistivity of fusible metals Cd, Zn, Pb on the degree of their purity was studied using the non-destructive technique of registering the decaying vortex currents induced in cylindrical samples after dropping the external magnetic field. The aim of the work was to determine the possibility of evaluating the purity of fusible metals using a simple methodology for measuring the characteristic times of decay of vortex currents at 77 K without the use of liquid helium. The computer analysis of the recorded signals presented in the form of decaying curves allowed finding the areas where the signal can be represented as an exponent with a characteristic decay time τ and determining a formula that related τ, specific resistance ρ, and the diameter of cylindrical samples. A comparison of the ρ values of both the initial samples of cadmium, zinc, lead, and archaeological lead, and those samples after various purification procedures, allowed establishing the dependence of the resistivity on the purity of the studied materials at the temperature of liquid nitrogen ρ77. The greater the difference in the purity of the fusible metal, the more their values ρ77 were different. Thus, the authors substantiated the possibility of a qualitative assessment of the purity of metals using contactless measurement and comparison of ρ77 for samples obtained after growing and various deep purification procedures.
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液氮温度下非接触比电阻法测定Cd、Zn、Pb纯度
高纯度易熔金属Cd、Zn、Pb和archPb被用作半导体和基于CdTe、CdZnTe、CdWO4、PbWO4、ZnWO4的低背景闪烁探测器的组成元素,用于记录电离辐射和寻找暗物质粒子、稀有α和β衰变。探测器的检测效率和灵敏度在很大程度上取决于探测器材料组成元素的纯度。采用非破坏性记录法,研究了可熔金属Cd、Zn、Pb在外加磁场作用下在圆柱形试样中产生的衰减涡流,研究了其电阻率随纯度的变化规律。这项工作的目的是确定在不使用液氦的情况下,使用一种简单的方法来测量77 K时涡流衰减的特征时间,从而评估易熔金属纯度的可能性。对以衰减曲线形式呈现的记录信号的计算机分析允许找到信号可以表示为具有特征衰减时间τ的指数的区域,并确定与τ,比电阻ρ和圆柱形样品直径相关的公式。对镉、锌、铅和考古铅的初始样品和经过各种净化程序的样品的ρ值进行比较,可以建立在液氮ρ77温度下电阻率与所研究材料纯度的依赖关系。可熔金属纯度差异越大,其ρ77值差异越大。因此,作者证实了使用非接触测量和对生长和各种深度净化程序后获得的样品的ρ77进行定性评估金属纯度的可能性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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