Effects of amplitude modulation in jitter tolerance measurements of communication devices

M. Ishida, Takahiro J. Yamaguchi, M. Soma, H. Musha
{"title":"Effects of amplitude modulation in jitter tolerance measurements of communication devices","authors":"M. Ishida, Takahiro J. Yamaguchi, M. Soma, H. Musha","doi":"10.1109/ATS.2002.1181683","DOIUrl":null,"url":null,"abstract":"This paper presents an experimental study of random jitter modulation in a commercial serializer-deserializer device to demonstrate the effects of possible amplitude modulation in jitter tolerance measurements. The paper recommends alternative methods for injecting random jitter to avoid this source of measurement error.","PeriodicalId":199542,"journal":{"name":"Proceedings of the 11th Asian Test Symposium, 2002. (ATS '02).","volume":"105 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2002-11-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 11th Asian Test Symposium, 2002. (ATS '02).","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS.2002.1181683","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4

Abstract

This paper presents an experimental study of random jitter modulation in a commercial serializer-deserializer device to demonstrate the effects of possible amplitude modulation in jitter tolerance measurements. The paper recommends alternative methods for injecting random jitter to avoid this source of measurement error.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
调幅对通信设备抖动容差测量的影响
本文介绍了在商用串行-反序列化装置中随机抖动调制的实验研究,以演示可能的幅度调制对抖动公差测量的影响。本文推荐了注入随机抖动的替代方法,以避免这种测量误差的来源。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Time slot specification based approach to analog fault diagnosis using built-in current sensors and test point insertion Efficient circuit specific pseudoexhaustive testing with cellular automata A ROMless LFSR reseeding scheme for scan-based BIST A fault-tolerant architecture for symmetric block ciphers High precision result evaluation of VLSI
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1