{"title":"An efficient yield optimization method using a two step linear approximation of circuit performance","authors":"Zhihua Wang, S. W. Director","doi":"10.1109/EDTC.1994.326817","DOIUrl":null,"url":null,"abstract":"A novel method for the estimation of yield of integrated circuits based on a two step linear approximation of circuit performance is proposed. By using this method, only one complete circuit simulation is needed for the estimation of yield. A new algorithm for yield optimization is also presented. It is based on the random direction stochastic approximation and does not require the evaluation of yield gradients. Examples are given to demonstrate the efficiency of the algorithm.<<ETX>>","PeriodicalId":244297,"journal":{"name":"Proceedings of European Design and Test Conference EDAC-ETC-EUROASIC","volume":"30 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-02-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"32","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of European Design and Test Conference EDAC-ETC-EUROASIC","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EDTC.1994.326817","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 32
Abstract
A novel method for the estimation of yield of integrated circuits based on a two step linear approximation of circuit performance is proposed. By using this method, only one complete circuit simulation is needed for the estimation of yield. A new algorithm for yield optimization is also presented. It is based on the random direction stochastic approximation and does not require the evaluation of yield gradients. Examples are given to demonstrate the efficiency of the algorithm.<>
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