Evaluation of test generation algorithms

Y. Min, Zhongcheng Li
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Abstract

Many ATPG algorithms are proposed every year. Evaluation of ATPG algorithms not only provides possibility to compare algorithms, but also predicts required computation resources for design and test of extra large circuits. The evaluation includes aspects of fault coverage, computation efficiency, and test set size. ISCAS 85 and ISCAS 89 benchmark circuits are available common examples for the evaluation. This paper presents a general methodology for the evaluation in spite of the difference of the computing environments that the algorithms run in. Eleven ATPG algorithms are evaluated, as a case study, based on the data of their experimental results published in the literature to show the feasibility and validation of the methodology presented.<>
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测试生成算法的评估
每年都有许多ATPG算法被提出。对ATPG算法的评价不仅为算法的比较提供了可能,而且为超大电路的设计和测试预测了所需的计算资源。评估包括故障覆盖率、计算效率和测试集大小等方面。ISCAS 85和ISCAS 89基准电路是可用于评估的常用示例。本文提出了一种通用的评估方法,尽管算法运行的计算环境不同。基于文献中发表的实验结果数据,作为案例研究评估了11种ATPG算法,以显示所提出方法的可行性和有效性。
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