{"title":"A test methodology to monitor and predict early life reliability failure mechanisms","authors":"T. R. Conrad, R.J. Mielnik, L. S. Musolino","doi":"10.1109/RELPHY.1988.23439","DOIUrl":null,"url":null,"abstract":"A description is given of a test methodology called operational life testing (OLT), which has been implemented to monitor and quantify the early-life reliability of selected semiconductor technologies and identify early-life failure mechanisms. This monitor measures the effectiveness of screens and tests used to remove device infant-mortality failure modes. In addition, the early-life reliability monitor complements the data derived from highly accelerated long-term reliability tests since it highlights specific failure modes which are not predominant in highly accelerated long-term reliability tests. Information gained from the monitor can be used to implement tests and screens designed to eliminate certain failure modes in a more timely manner than accumulating and analyzing field return data.<<ETX>>","PeriodicalId":102187,"journal":{"name":"26th Annual Proceedings Reliability Physics Symposium 1988","volume":"71 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1988-04-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"26th Annual Proceedings Reliability Physics Symposium 1988","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RELPHY.1988.23439","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4
Abstract
A description is given of a test methodology called operational life testing (OLT), which has been implemented to monitor and quantify the early-life reliability of selected semiconductor technologies and identify early-life failure mechanisms. This monitor measures the effectiveness of screens and tests used to remove device infant-mortality failure modes. In addition, the early-life reliability monitor complements the data derived from highly accelerated long-term reliability tests since it highlights specific failure modes which are not predominant in highly accelerated long-term reliability tests. Information gained from the monitor can be used to implement tests and screens designed to eliminate certain failure modes in a more timely manner than accumulating and analyzing field return data.<>
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