Modifications for Reliability of Bootstrapped Switches in Low Voltage Switched-Capacitor Circuits

Abstract

One of the possible solutions to the low voltage applications of modern integrated circuit, which was widely demanded by recently developed submicron CMOS technology, is the bootstrapped switch technique. In order to overcome its drawbacks such like the reliability issue on the main signal switch during the clock transition, three different approaches were proposed in this paper along with the simulation results. The oxide lifetime can benefit from these modifications without much circuit degradation.