Extension of the boundary-scan architecture and new idea of BIST for more effective testing and self-testing of interconnections

Abstract

The approach presented in this paper enables more effective testing of on-board and board-to-board interconnections and significantly simplifies the interconnection self-testing. Some extensions must be added to the Boundary Scan Architecture which, however, do not violate the JTAG/IEEE1149.1 standard requirements. Benefits are the reduced complexity and cost of an on-board testing unit as well as better test performance.