J. Siu, Y. Eslami, A. Sheikholeslami, P. Gulak, T. Endo, S. Kawashima
{"title":"A 16 kb 1T1C FeRAM test chip using current-based reference scheme","authors":"J. Siu, Y. Eslami, A. Sheikholeslami, P. Gulak, T. Endo, S. Kawashima","doi":"10.1109/CICC.2002.1012777","DOIUrl":null,"url":null,"abstract":"A 16 kb 1T1C FeRAM test chip is designed and fabricated in a 0.35 /spl mu/m FeRAM process. The test chip uses a reference generation scheme that balances fatigue evenly between memory cells and reference cells, hence providing the 1T1C cell with 2T2C robustness to fatigue. The test chip achieves an access time of 62 ns at 3V.","PeriodicalId":209025,"journal":{"name":"Proceedings of the IEEE 2002 Custom Integrated Circuits Conference (Cat. No.02CH37285)","volume":"58 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the IEEE 2002 Custom Integrated Circuits Conference (Cat. No.02CH37285)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CICC.2002.1012777","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5
Abstract
A 16 kb 1T1C FeRAM test chip is designed and fabricated in a 0.35 /spl mu/m FeRAM process. The test chip uses a reference generation scheme that balances fatigue evenly between memory cells and reference cells, hence providing the 1T1C cell with 2T2C robustness to fatigue. The test chip achieves an access time of 62 ns at 3V.
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