Double Edge-Triggered Tristate Flip-Flop Physical Unclonable Function for Secure IoT Ecosystem

Hemavathy Sriramulu, V. S. K. Bhaaskaran
{"title":"Double Edge-Triggered Tristate Flip-Flop Physical Unclonable Function for Secure IoT Ecosystem","authors":"Hemavathy Sriramulu, V. S. K. Bhaaskaran","doi":"10.1109/iSES52644.2021.00022","DOIUrl":null,"url":null,"abstract":"The sequential circuit in the clock distribution consumes a substantial amount of power in a digital system. The digital circuitry in the security devices requires low power and energy with increased throughput. In this paper, the security of the IoT devices have been realized using Physical Unclonable Functions (PUF). The proposed Double Edge-Triggered Tristate Flip-Flop PUF (DETTFF PUF) demonstrates significantly enhanced PUF metrics and robustness. The reduced power and energy of the proposed architecture can make DETTFF PUF a preferable choice in the IoT ecosystem. Comparison against the conventional double edge-triggered flip-flops to validate the structure. The design is also compared with conventional double edge-triggered flip-flops to elucidate the significance of the proposed architecture.","PeriodicalId":293167,"journal":{"name":"2021 IEEE International Symposium on Smart Electronic Systems (iSES) (Formerly iNiS)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 IEEE International Symposium on Smart Electronic Systems (iSES) (Formerly iNiS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/iSES52644.2021.00022","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4

Abstract

The sequential circuit in the clock distribution consumes a substantial amount of power in a digital system. The digital circuitry in the security devices requires low power and energy with increased throughput. In this paper, the security of the IoT devices have been realized using Physical Unclonable Functions (PUF). The proposed Double Edge-Triggered Tristate Flip-Flop PUF (DETTFF PUF) demonstrates significantly enhanced PUF metrics and robustness. The reduced power and energy of the proposed architecture can make DETTFF PUF a preferable choice in the IoT ecosystem. Comparison against the conventional double edge-triggered flip-flops to validate the structure. The design is also compared with conventional double edge-triggered flip-flops to elucidate the significance of the proposed architecture.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
安全物联网生态系统的双向触发三态触发器物理不可克隆功能
时钟分布中的顺序电路在数字系统中消耗大量的功率。安全器件中的数字电路要求低功耗和能量,同时提高吞吐量。本文采用物理不可克隆功能(Physical unclable Functions, PUF)来实现物联网设备的安全。提出的双边缘触发三态触发器PUF (DETTFF PUF)具有显著增强的PUF指标和鲁棒性。所提出的架构降低了功耗和能量,可以使DETTFF PUF成为物联网生态系统中的首选。与传统的双棱触发触发器进行比较,验证其结构。该设计还与传统的双面触发触发器进行了比较,以阐明所提出的架构的意义。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Implementation of Self-Controlled Wheelchairs based on Joystick, Gesture Motion and Voice Recognition Dynamic Two Hand Gesture Recognition using CNN-LSTM based networks Performance Assessment of Dual Metal Graded Channel Negative Capacitance Junctionless FET for Digital/Analog field VLSI Architecture of Sigmoid Activation Function for Rapid Prototyping of Machine Learning Applications. Influence of Nanosilica in PVDF Thin Films for Sensing Applications
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1