{"title":"Extraction of current signatures for simulation of simultaneous switching noise in high speed digital systems","authors":"R. Mandrekar, M. Swaminathan, S. Chun","doi":"10.1109/EPEP.2003.1249996","DOIUrl":null,"url":null,"abstract":"This paper describes a measurement based approach for extraction of the current signature to simulate switching noise in complex high speed systems. The approach is tested on a high speed functioning computer system from Sun Microsystems. Using the current source developed, simultaneous switching noise in the core power distribution network of the system has been simulated with good accuracy.","PeriodicalId":254477,"journal":{"name":"Electrical Performance of Electrical Packaging (IEEE Cat. No. 03TH8710)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-12-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Electrical Performance of Electrical Packaging (IEEE Cat. No. 03TH8710)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPEP.2003.1249996","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 7
Abstract
This paper describes a measurement based approach for extraction of the current signature to simulate switching noise in complex high speed systems. The approach is tested on a high speed functioning computer system from Sun Microsystems. Using the current source developed, simultaneous switching noise in the core power distribution network of the system has been simulated with good accuracy.
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