{"title":"Environmental impact on the reliability of mass produced consumer glucose meters","authors":"A. Fong, B. Fong, G. Hong","doi":"10.1109/ICIEA.2011.5975541","DOIUrl":null,"url":null,"abstract":"The soaring number of diabetes patients in many metropolitan cities makes mass-produced wearable glucose meters a very profit sector of the medical device industry. Two vitally important factors in the manufacturing of consumer medical devices are reliability and safety. These devices need to be manufactured at the lowest possible cost and must operate predictably according to design specifications. Since each device produced from one production line will be subject to different operating environment during its useful lifetime, this paper seeks to explore the methodology for optimizing reliability with condition-based monitoring of an individual device.","PeriodicalId":304500,"journal":{"name":"2011 6th IEEE Conference on Industrial Electronics and Applications","volume":"98 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-06-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 6th IEEE Conference on Industrial Electronics and Applications","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICIEA.2011.5975541","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
The soaring number of diabetes patients in many metropolitan cities makes mass-produced wearable glucose meters a very profit sector of the medical device industry. Two vitally important factors in the manufacturing of consumer medical devices are reliability and safety. These devices need to be manufactured at the lowest possible cost and must operate predictably according to design specifications. Since each device produced from one production line will be subject to different operating environment during its useful lifetime, this paper seeks to explore the methodology for optimizing reliability with condition-based monitoring of an individual device.