Cryogenic DC characterization of InAs/Al80Ga20Sb self-switching diodes

A. Westlund, G. Moschetti, P. Nilsson, J. Grahn, L. Desplanque, X. Wallart
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引用次数: 1

Abstract

DC characterization of an InAs/Al80Ga20Sb self-switching diode for THz detection is presented at 300 K and 6 K. Compared to 300 K, an enhancement of the diode I-V nonlinearity and associated responsivity was observed under zerobias conditions at 6 K. The intrinsic responsivity was estimated to 490 V/W at 300 K and 4400 V/W at 6 K.
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InAs/Al80Ga20Sb自开关二极管的低温直流特性研究
介绍了一种用于太赫兹探测的InAs/Al80Ga20Sb自开关二极管在300 K和6 K下的直流特性。与300 K相比,在6 K的零偏条件下,二极管的I-V非线性和相关的响应性增强。在300 K和6 K时,其固有响应率分别为490 V/W和4400 V/W。
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