{"title":"Determination of thickness and dielectric constant of coatings from capacitance measurements","authors":"A. Guadanama-Santana, A. García-Valenzuela","doi":"10.1109/MIM.2007.4343564","DOIUrl":null,"url":null,"abstract":"We show it is possible to measure both the dielectric constant and thickness of dielectric coating on a flat conducting substrate from two capacitance measurements. We discuss the principles of measurement, present numerical simulations, and a proof of principle experiment","PeriodicalId":244878,"journal":{"name":"2005 IEEE Instrumentationand Measurement Technology Conference Proceedings","volume":"45 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-10-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2005 IEEE Instrumentationand Measurement Technology Conference Proceedings","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MIM.2007.4343564","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
We show it is possible to measure both the dielectric constant and thickness of dielectric coating on a flat conducting substrate from two capacitance measurements. We discuss the principles of measurement, present numerical simulations, and a proof of principle experiment
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