4nm Voltage Auto-Tracking SRAM Pulse Generator with Fully RC Optimized Row Auto-Tracking Write Assist Circuits

Inhak Lee, Dongwook Seo, Yunrong Li, Mijoung Kim, Sangyeop Baeck
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Abstract

Providing performance-and-power optimized SRAM compiler with wide a range of operating voltages and configurations is a major challenge in advanced technologies. In this paper, the Row Auto-Tracking Write Assist (RATWA) and Voltage Auto-Tracking Pulse Generator (VATPG) are proposed to overcome major two issues in the SRAM compiler. The RATWA efficiently controls the strength of write assist under various types of SRAM RPB (Rows Per Bitline), and it demonstrates a 7% dynamic power improvement, especially at 64 RPB. The VATPG adaptively adjusts the gate level of the tracking circuit and shows a stable read margin across a wide range of voltages, up to 22% SRAM read speed improvement, and 9% dynamic power saving at higher voltage ranges.
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4nm电压自动跟踪SRAM脉冲发生器与完全RC优化行自动跟踪写辅助电路
提供具有广泛工作电压和配置的性能和功耗优化的SRAM编译器是先进技术的主要挑战。本文提出了行自动跟踪写辅助(RATWA)和电压自动跟踪脉冲发生器(VATPG)来克服SRAM编译器中的两个主要问题。在不同类型的SRAM RPB下,RATWA有效地控制了写辅助的强度,并且它显示了7%的动态功率改进,特别是在64 RPB下。VATPG自适应调整跟踪电路的门电平,并在宽电压范围内显示稳定的读取余量,高达22%的SRAM读取速度提高,在更高电压范围内节省9%的动态功率。
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