OPTIMIZED MEASUREMENT METHOD OF SMALL GAUGE LENGTH USING STEGER ALGORITHM

Abstract

Described an measuring system for the use of gauge block measurement. Optical sources of the system is a highly stabilized laser with the wavelength of 532nm, and a 633nm wavelength laser of worse laser monochromaticity. For the use of interference graph capturing, a CCD sensor is introduced into the system. Fractional part of the interference fringes is calculated by image processing procedures. Gauge length is obtained by the interference fringe fraction coincident method. By applying Steger algorithm to extract by fringe centerline, fractional part of the interference fringe order can be accurately obtained. Highly accurate gauge length measurement in relatively simple experiment conditions can be realized with the system, as the demand on laser monochromaticity that interference fringe fraction coincidence method raises can be markedly decreased.