{"title":"A Status Monitoring Method for Multi-parallel Choppers in Wind Turbine Converters","authors":"R. Wu, Masoud Parkhou","doi":"10.1109/PEDG48541.2020.9244386","DOIUrl":null,"url":null,"abstract":"The multi-parallel chopper system is commonly used in modern MW-level wind turbine converters. Even though the chopper is usually considered as robust and reliable, the semiconductor module can suffer critical junction temperature in extreme fault ride through (FRT) events. This paper proposes a method to monitor and identify if the individual chopper is functioning, degraded, or failed by means of collecting and comparing the parallel semiconductors' temperatures during FRT events. A simulation model is created in PLCES, the accuracy of which is further validated by a dedicated experimental setup including an infrared camera. The proposed method is verified by PLECS simulations.","PeriodicalId":249484,"journal":{"name":"2020 IEEE 11th International Symposium on Power Electronics for Distributed Generation Systems (PEDG)","volume":"72 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-09-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 IEEE 11th International Symposium on Power Electronics for Distributed Generation Systems (PEDG)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/PEDG48541.2020.9244386","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
The multi-parallel chopper system is commonly used in modern MW-level wind turbine converters. Even though the chopper is usually considered as robust and reliable, the semiconductor module can suffer critical junction temperature in extreme fault ride through (FRT) events. This paper proposes a method to monitor and identify if the individual chopper is functioning, degraded, or failed by means of collecting and comparing the parallel semiconductors' temperatures during FRT events. A simulation model is created in PLCES, the accuracy of which is further validated by a dedicated experimental setup including an infrared camera. The proposed method is verified by PLECS simulations.
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