{"title":"Determination of elastic properties of surface layers and coatings","authors":"M. Ševčík, M. Husák","doi":"10.1109/ASDAM.2014.6998648","DOIUrl":null,"url":null,"abstract":"This paper shows determination of elastic constants of thin layers deposited on substrates. Resonant ultrasound spectroscopy is used to measure resonant spectras before and after layer deposition. These two spectra are compared and changes in the position of the resonant peaks are associated with layer properties. For thin layers either the elastic moduli or the surface mass density can be determined, providing the complementary information.","PeriodicalId":313866,"journal":{"name":"The Tenth International Conference on Advanced Semiconductor Devices and Microsystems","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2014-12-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"The Tenth International Conference on Advanced Semiconductor Devices and Microsystems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASDAM.2014.6998648","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
This paper shows determination of elastic constants of thin layers deposited on substrates. Resonant ultrasound spectroscopy is used to measure resonant spectras before and after layer deposition. These two spectra are compared and changes in the position of the resonant peaks are associated with layer properties. For thin layers either the elastic moduli or the surface mass density can be determined, providing the complementary information.
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