Characterization of PCB s-parameters with a new calibration method

Cheng Ning, M. Resso, Zhu Wenxue, Jia Gongxian, Long Faming
{"title":"Characterization of PCB s-parameters with a new calibration method","authors":"Cheng Ning, M. Resso, Zhu Wenxue, Jia Gongxian, Long Faming","doi":"10.1109/APEMC.2016.7523021","DOIUrl":null,"url":null,"abstract":"There are several existing techniques like Direct Loss Subtraction, Through-Reflection-Line (TRL) calibration and Automatic Fixture Removal (AFR) with 2XThrough fixtures for characterizing PCB unit length insertion loss. In this paper, 1) a new method for characterizing PCB loss by using AFR with 1X Open fixtures is proposed. This new method has been proved to have the similar accuracy with TRL and AFR with 2X throughs, but can save much more PCB area and measurement time; 2) based on measurements of transmission lines with different reference impedance, the measurement bandwidth, accuracy, efficiency and cost of these techniques are compared.","PeriodicalId":358257,"journal":{"name":"2016 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-05-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/APEMC.2016.7523021","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 9

Abstract

There are several existing techniques like Direct Loss Subtraction, Through-Reflection-Line (TRL) calibration and Automatic Fixture Removal (AFR) with 2XThrough fixtures for characterizing PCB unit length insertion loss. In this paper, 1) a new method for characterizing PCB loss by using AFR with 1X Open fixtures is proposed. This new method has been proved to have the similar accuracy with TRL and AFR with 2X throughs, but can save much more PCB area and measurement time; 2) based on measurements of transmission lines with different reference impedance, the measurement bandwidth, accuracy, efficiency and cost of these techniques are compared.
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用一种新的校准方法表征PCB s参数
有几种现有的技术,如直接损耗减法,通过反射线(TRL)校准和自动夹具移除(AFR)与2XThrough夹具表征PCB单位长度插入损耗。本文提出了一种利用带有1X Open夹具的AFR表征PCB损耗的新方法。经实践证明,该方法具有与TRL和AFR相似的精度,但可以节省更多的PCB面积和测量时间;2)通过对不同参考阻抗的传输线的测量,比较了这些技术的测量带宽、精度、效率和成本。
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