Interoperability Between Non Conventional Instrument Transformers (NCIT) and Intelligent Electronic Devices (IDE)

D. Chatrefou, J. Dupraz, G. Montillet
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引用次数: 9

Abstract

Further to papers presented two years ago, at the IEEE T&D in Dallas, on non conventional instrument transformers (NCIT), advancement of the interoperability between sensors and processes are updated. Electronic technology has dramatically evolved in the last decade and the consequence is the generalization of digital designs for merging-units (MU) and intelligent electronic devices (IDE). Digital apparatus are an obvious improvement in output accuracy. These digital apparatus offer many potential advantages and are expected to grow in importance in the next decade
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非常规仪表变压器(NCIT)与智能电子设备(IDE)之间的互操作性
继两年前在达拉斯举行的IEEE T&D上发表的关于非常规仪表变压器(NCIT)的论文之后,传感器和过程之间互操作性的进展得到了更新。在过去的十年中,电子技术得到了巨大的发展,其结果是合并单元(MU)和智能电子设备(IDE)的数字设计的推广。数字仪器在输出精度上有明显的提高。这些数字设备提供了许多潜在的优势,预计在未来十年将变得越来越重要
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